IEC 60747-18-4:2023

IEC 60747-18-4
®

Edition 1.0 2023-03
INTERNATIONAL
STANDARD

colour
inside


Semiconductor devices –
Part 18-4: Semiconductor bio sensors – Evaluation method of noise
characteristics of lens-free CMOS photonic array sensors

IEC 60747-18-4:2023-03(en)

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IEC 60747-18-4

®


Edition 1.0 2023-03




INTERNATIONAL



STANDARD








colour

inside










Semiconductor devices –

Part 18-4: Semiconductor bio sensors – Evaluation method of noise

characteristics of lens-free CMOS photonic array sensors

























INTERNATIONAL

ELECTROTECHNICAL


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ICS 31.080.99 ISBN 978-2-8322-6643-4




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– 2 – IEC 60747-18-4:2023 © IEC 2023
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Measurement setup . 7
4.1 General . 7
4.2 Measurement system . 7
5 Measurement . 7
5.1 General . 7
5.2 Spatial noise . 8
5.2.1 DFPN: Dark fixed pattern noise (without illumination) . 8
5.2.2 PRNU: Photo response non uniformity (with illumination) . 9
5.3 Temporal noise . 10
5.3.1 RRN: Random read noise . 10
6 Test report . 12
Annex A (informative) Test report . 13
Bibliography . 14

Figure 1 – Measurement workflow . 7
Figure 2 – n trial data of frame capture . 8
Figure 3 – Dark frame subtracted data . 9
Figure 4 – Two frame subtracted data . 11

Table A.1 – Test environment specifications of CMOS photonic array sensor . 13

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IEC 60747-18-4:2023 © IEC 2023 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

SEMICONDUCTOR DEVICES –

Part 18-4: Semiconductor bio sensors – Evaluation method of noise
characteristics of lens-free CMOS photonic array sensors

FOREWORD
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rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 60747-18-4 has been prepared by subcommittee 47E: Discrete semiconductor devices, of
IEC technical committee 47: Semiconductor devices. It is an International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
47E/778/CDV 47E/790/RVC

Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.

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– 4 – IEC 60747-18-4:2023 © IEC 2023
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 60747 series, published under the general title Semiconductor
devices, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The "colour inside" logo on the cover page of this document indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.

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IEC 60747-18-4:2023 © IEC 2023 – 5 –
INTRODUCTION
The IEC 60747-18 series on semiconductor bio sensors is composed of the following parts:
• IEC 60747-18-1 defines the test method and data analysis for calibration of lens-free CMOS
photonic array sensors;
1
• IEC 60747-18-2 [1] defines the evaluation process of lens-free CMOS photonic array
sensor package modules;
• IEC 60747-18-3 [2] defines the fluid flow characteristics of lens-free CMOS photonic array
sensor package modules with fluidic system;
• IEC 60747-18-4 defines the evaluation method of noise characteristics of lens-free CMOS
photonic array sensors;
• IEC 60747-18-5 [3] defines the evaluation method for light responsivity characteristics of
lens-free CMOS photonic array sensor package modules by incident angle of light.
The IEC 60747-18 series [4] includes subjects such as noise analysis, long-term reliability tests,
test methods for lens-free CMOS photonic array sensor package modules under patchable
environments, test methods under implantable environments, etc.


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1
 Numbers in square brackets refer to the Bibliography.

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– 6 – IEC 60747-18-4:2023 © IEC 2023
SEMICONDUCTOR DEVICES –

Part 18-4: Semiconductor bio sensors – Evaluation method of noise
characteristics of lens-free CMOS photonic array sensors



1 Scope
This part of IEC 60747 specifies the evaluation method for noise characteristics of lens-free
CMOS photonic array sensors. This document includes the measurement setup, test procedure,
test items, evaluation method, and test report for noise characteristics of lens-free CMOS
photonic array sensors.
2 Normative references
The following documents are referred to in the text in
...